Title :
Alpha induced SEU and MBU rates evaluation for advanced SRAMs by Monte-Carlo simulations
Author :
Mérelle, T. ; Saigné, F. ; Sagnes, B. ; Gasiot, G. ; Roche, Ph. ; Carrière, T. ; Palau, M.C.
Abstract :
Based on Monte-Carlo simulations, a previously presented 3D methodology to quantify MBU occurrences in neutronic environment is adapted to an alpha environment. Experimental and simulated results are compared for a 130 nm commercial SRAM.
Keywords :
SRAM chips; alpha-particle effects; neutron effects; Monte-Carlo simulations; SRAM; alpha environment; multiple bit upset; neutronic environment; single event upset; Alpha particles; CMOS technology; Discrete event simulation; Error analysis; Error correction; Error correction codes; Neutrons; Random access memory; Research and development; Single event upset; Alpha particles; MBU; Monte-Carlo; SEU; SRAM; bulk; diffusion;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2005.4365589
