DocumentCode :
1895399
Title :
A full-function COTS tester for B-2 avionics
Author :
Cadogan, Margaret D. ; Moorehead, J. Michael
Author_Institution :
Assembly Test Div., Teradyne Inc., Boston, MA, USA
fYear :
1997
fDate :
22-25 Sep 1997
Firstpage :
218
Lastpage :
223
Abstract :
This paper describes the integration efforts by Teradyne and Hewlett-Packard to produce the Radio Frequency Analog Digital (RFAD) tester for the B-2 Depot at Tinker AFB. The objective was to combine commercial-off-the-shelf (COTS) components while meeting the depot´s system-level performance requirements. This paper discusses aspects of the integration effort, including hardware integration and test, software integration, and verification of system specifications. Hardware topics include the use of a matrix switching configuration to provide hybrid digital/analog pins and an RF interface switch matrix to ensure signal integrity at the RF system interface. Software topics include the integration of Teradyne´s ProgramGuide software with Hewlett-Packard´s Visual Engineering Environment (HP VEE) to provide a single, integrated test executive environment. The paper also discusses the self-test and normalization techniques used to ensure signal specifications are met at the RFAD´s interfaces. The conclusion summarizes the challenges of integrating COTS test hardware and software on the scale required by the B-2 Depot, and describes technology that can be applied to a wide range of avionics applications
Keywords :
automatic test equipment; automatic test software; avionics; computer interfaces; electronic equipment testing; integrated software; military avionics; peripheral interfaces; visual programming; B-2 Depot; B-2 avionics; COTS test hardware; COTS test software; Hewlett-Packard; Hewlett-Packard´s Visual Engineering Environment; RF interface switch matrix; Radio Frequency Analog Digital tester; Teradyne; Tinker AFB; commercial-off-the-shelf components; hardware integration; hybrid digital/analog pins; integrated test executive environment; integration; matrix switching; normalization; self-test; software integration; Aerospace electronics; Application software; Built-in self-test; Hardware; Pins; RF signals; Radio frequency; Software testing; Switches; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-4162-7
Type :
conf
DOI :
10.1109/AUTEST.1997.633615
Filename :
633615
Link To Document :
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