Title :
Chapter 9, Delamination related failures
Keywords :
Bonding; Delamination; Failure analysis; Gas insulated transmission lines; Microelectronics; Packaging; US Department of Energy;
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
Print_ISBN :
0-7803-9062-8
DOI :
10.1109/ESIME.2005.1502796
