• DocumentCode
    1895677
  • Title

    Radiation hardness test of FSSR, a multichannel, mixed signal chip for microstrip detector readout

  • Author

    Ratti, Lodovico ; Manghisoni, Massimo ; Re, Valerio ; Traversi, Gianluca ; Candelori, Andrea

  • Author_Institution
    Univ. di Pavia, Pavia
  • fYear
    2005
  • fDate
    19-23 Sept. 2005
  • Abstract
    The Fermilab Silicon Strip Readout (FSSR) chip is a 128-channel, mixed signal circuit, which was designed for processing the signals from the microstrip detectors of the BTeV experiment at the Tevatron collider. The design was carried out in a 0.25 mum CMOS technology, whose intrinsic radiation hardness is supposed to satisfy the application requirements. Such features were further improved by using radiation tolerant layout techniques. A prototype chip, including several variants of the analog front-end electronics and different test structures, has been exposed to 27 MeV protons. A second version of the chip (referred to as FSSR2), where some modifications were implemented with respect to the previous one, has been irradiated with gamma-rays from a 60Co source. This paper is devoted to presenting the results of the radiation hardness tests and assessing the suitability of the chip for operation in extremely harsh environments.
  • Keywords
    microstrip circuits; mixed analogue-digital integrated circuits; particle detectors; radiation hardening (electronics); readout electronics; gamma-ray irradiation; Fermilab silicon strip readout chip; analog front-end electronics; microstrip detectors; mixed signal chip; mixed signal circuit; radiation hardness; radiation tolerant layout; CMOS technology; Circuit testing; Electronic equipment testing; Microstrip; Process design; Radiation detectors; Signal design; Signal processing; Silicon; Strips; front-end electronics; ionization damage; microstrip detector readout; proton radiation effects; ¿-rays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
  • Conference_Location
    Cap d´Agde
  • ISSN
    0379-6566
  • Print_ISBN
    978-0-7803-9502-2
  • Electronic_ISBN
    0379-6566
  • Type

    conf

  • DOI
    10.1109/RADECS.2005.4365602
  • Filename
    4365602