DocumentCode
1895677
Title
Radiation hardness test of FSSR, a multichannel, mixed signal chip for microstrip detector readout
Author
Ratti, Lodovico ; Manghisoni, Massimo ; Re, Valerio ; Traversi, Gianluca ; Candelori, Andrea
Author_Institution
Univ. di Pavia, Pavia
fYear
2005
fDate
19-23 Sept. 2005
Abstract
The Fermilab Silicon Strip Readout (FSSR) chip is a 128-channel, mixed signal circuit, which was designed for processing the signals from the microstrip detectors of the BTeV experiment at the Tevatron collider. The design was carried out in a 0.25 mum CMOS technology, whose intrinsic radiation hardness is supposed to satisfy the application requirements. Such features were further improved by using radiation tolerant layout techniques. A prototype chip, including several variants of the analog front-end electronics and different test structures, has been exposed to 27 MeV protons. A second version of the chip (referred to as FSSR2), where some modifications were implemented with respect to the previous one, has been irradiated with gamma-rays from a 60Co source. This paper is devoted to presenting the results of the radiation hardness tests and assessing the suitability of the chip for operation in extremely harsh environments.
Keywords
microstrip circuits; mixed analogue-digital integrated circuits; particle detectors; radiation hardening (electronics); readout electronics; gamma-ray irradiation; Fermilab silicon strip readout chip; analog front-end electronics; microstrip detectors; mixed signal chip; mixed signal circuit; radiation hardness; radiation tolerant layout; CMOS technology; Circuit testing; Electronic equipment testing; Microstrip; Process design; Radiation detectors; Signal design; Signal processing; Silicon; Strips; front-end electronics; ionization damage; microstrip detector readout; proton radiation effects; ¿-rays;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location
Cap d´Agde
ISSN
0379-6566
Print_ISBN
978-0-7803-9502-2
Electronic_ISBN
0379-6566
Type
conf
DOI
10.1109/RADECS.2005.4365602
Filename
4365602
Link To Document