DocumentCode :
1895722
Title :
SPICE modelling of a discrete COTS SiGe HBT for digital applications up to MGy dose levels
Author :
Van Uffelen, M. ; Geboers, S. ; Leroux, P. ; Berghmans, F.
Author_Institution :
SCK-CEN, Mol
fYear :
2005
fDate :
19-23 Sept. 2005
Abstract :
Future maintenance tasks of the international experimental thermonuclear fusion reactor (ITER) will require communication links between the remotely operated equipment in the reactor vessel and the control room, that are radiation tolerant up to MGy dose levels. We therefore assessed the DC behaviour of a COTS SiGe heterojunction bipolar transistor (HBT) under gamma radiation up to more than 4 MGy. The DC current gain (beta) presents a limited loss of about 30% for a base current of 100 muA. Our in-situ measurements allowed us to adapt the manufacturer´s SPICE model and account for these radiation effects. Circuit-hardened driving electronics for both photonic transmitters and receivers can hence be designed.
Keywords :
Ge-Si alloys; SPICE; gamma-ray effects; heterojunction bipolar transistors; semiconductor materials; DC current gain; HBT; SPICE modelling; SiGe; circuit-hardened driving electronics; gamma radiation; heterojunction bipolar transistor; photonic receivers; photonic transmitters; reactor vessel; thermonuclear fusion reactor; Communication system control; Fusion reactors; Gamma rays; Germanium silicon alloys; Heterojunction bipolar transistors; Inductors; Optical losses; SPICE; Silicon germanium; Virtual manufacturing; DC current gain; SPICE model; SiGe HBT; ionizing radiation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
ISSN :
0379-6566
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
Type :
conf
DOI :
10.1109/RADECS.2005.4365604
Filename :
4365604
Link To Document :
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