Title :
Embedded wire diagnosis sensor for intermittent fault location
Author :
Incarbone, Luca ; Auzanneau, Fabrice ; Ben Hassen, Wafa ; Bonhomme, Yannick
Author_Institution :
Lab. de Fiabilisation des Syst. Embarques, CEA, Gif-sur-Yvette, France
Abstract :
This paper presents an EMC (Electromagnetic Compatibility) compliant sensor able to detect and locate intermittent faults longer than 300 μs in wires in real time. The proposed System On Chip can diagnose any wire using different reflectometry-based methods. The injected signal´s spectrum is designed to ensure a continuous harmless diagnosis. The ASIC integrates the whole processing chain, i.e. the analog cells, in particular ADC/DAC, and the digital processing elements based on a custom processing unit (DSP-like) that analyzes in real time the reflected signal. An integrated oversampling system increases the ADC performance more than 20 times, enhancing the location accuracy down to 3 cm. The ASIC was realized in 130 nm TSMC technology and has a surface of 3 mm2. This paper presents intermittent fault detection and location results in a real network.
Keywords :
analogue-digital conversion; application specific integrated circuits; cable testing; digital-analogue conversion; electric sensing devices; electromagnetic compatibility; fault location; reflectometry; system-on-chip; wires (electric); ADC; ASIC; DAC; EMC; analog cells; analog-digital converter; custom processing unit; digital processing element; digital-analog converter; electromagnetic compatibility compliant sensor; embedded wire diagnosis sensor; intermittent fault detection; intermittent fault location; reflectometry based methods; size 130 nm; system-on-chip; Application specific integrated circuits; Circuit faults; Electromagnetic compatibility; Fault detection; Fault location; Reflectometry; Wires; ASIC; Diagnosis; MCTDR; OMTDR; Reflectometry; Wire; intermittent fault;
Conference_Titel :
SENSORS, 2014 IEEE
Conference_Location :
Valencia
DOI :
10.1109/ICSENS.2014.6985060