Title :
A fast global shutter image sensor based on the VOD mechanism
Author :
Tadmor, Erez ; Bakish, Idan ; Felzenshtein, Shlomo ; Larry, Eli ; Yahav, Giora ; Cohen, David
Author_Institution :
Adv. Imaging Technol. Group, Microsoft R&D Center, Haifa, Israel
Abstract :
This paper presents a method to realize a fast and uniform global shutter for time resolved imaging in standard, commercially available image sensors. Fast toggling of the substrate voltage is used in image sensors with a Vertical Overflow Drain (VOD) shutter mechanism, a common building block of IT-CCDs. Special measurements and analysis techniques were developed in order to characterize the shutter performance. Results show very good performance, with various potential applications such as Time-of-Flight imaging, transient imaging, and Fluorescence Lifetime Imaging Microscopy. Using off-the-shelf devices we were able to produce shutter rise and fall times of 1.5ns, and shutter contrast ratio of 1:50 or better. The global shutter temporal behavior is very uniform, with less than 200ps delay between the periphery and the center measured across 1/4" and 1/3" sensors. Moreover, neighboring pixels exhibit less than 50ps timing variation. The physical principles that allow this fast operation are discussed in detail and explained through measurement results supported by device simulations.
Keywords :
CCD image sensors; CMOS image sensors; fluorescence; optical microscopy; time resolved spectra; FLIM; IT-CCD; VOD mechanism; fluorescence lifetime imaging microscopy; global shutter image sensor; global shutter temporal behavior; off-the-shelf devices; time resolved imaging; time-of-flight imaging; transient imaging; vertical overflow drain; Image sensors; Logic gates; Photodiodes; Standards; Substrates; Charge coupled device (CCD); Fluorescence Lifetime Imaging Microscopy (FLIM); Time resolved; Time-of-Flight (TOF);
Conference_Titel :
SENSORS, 2014 IEEE
Conference_Location :
Valencia
DOI :
10.1109/ICSENS.2014.6985074