DocumentCode :
1896025
Title :
Predicting the mechanical behavior of self-deformed micromachined cantilevers
Author :
Pasupuleti, A. ; Sahin, F. ; Raisanen, A. ; Hebding, J.L. ; Walter, W.W. ; Hirschman, K.D.
Author_Institution :
Rochester Inst. of Technol., NY, USA
fYear :
2005
fDate :
18-20 April 2005
Firstpage :
254
Lastpage :
258
Abstract :
This research aims at characterizing and predicting the mechanical behavior of thin film materials that are used in micro electro mechanical systems (MEMS). Micro machined bilayer cantilevers of various dimensions were fabricated and analyzed to extract models. The models designed in this process are foreseen to be an essential tool for MEMS designers as they would relate the loading parameters, material properties and geometry of the microstructures with its performance characteristics. A computational methodology based on empirical modeling was developed that enables the designer to prototype the designs before fabrication. The proposed model generates accurate material properties applicable at the microscopic level, thereby accelerating the design and development process. The performance of the proposed model was compared to the experimental values and the results were found to be very encouraging.
Keywords :
deformation; micromachining; micromechanical devices; prototypes; thin films; MEMS; computational methodology; design prototype; empirical modeling; loading parameter; material properties; mechanical behavior prediction; micro electro mechanical systems; microstructure geometry; self-deformed micromachined cantilever; thin film materials; Fabrication; Geometry; Material properties; Mechanical systems; Micromechanical devices; Microstructure; Process design; Prototypes; Solid modeling; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
Print_ISBN :
0-7803-9062-8
Type :
conf
DOI :
10.1109/ESIME.2005.1502810
Filename :
1502810
Link To Document :
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