• DocumentCode
    1896040
  • Title

    Survey and comparison of various sample preparation techniques for the heavy ions backside irradiation of COTS VLSI

  • Author

    Courtade, Frédéric ; Bezerra, Françoise ; Duzellier, Sophie

  • Author_Institution
    CNES, Toulouse
  • fYear
    2005
  • fDate
    19-23 Sept. 2005
  • Abstract
    Taking into account current and future encapsulation techniques of COTS VLSI components, a survey of state-of-the-art sample preparation techniques for heavy ions backside irradiation has been performed and then evaluated on a SDRAM test vehicle.
  • Keywords
    DRAM chips; VLSI; ion beam effects; SDRAM test vehicle; commercial off the shelf VLSI components; heavy ions backside irradiation; preparation techniques; Assembly; Chip scale packaging; Encapsulation; Field programmable gate arrays; Integrated circuit packaging; Ion beams; Metallization; Silicon; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
  • Conference_Location
    Cap d´Agde
  • ISSN
    0379-6566
  • Print_ISBN
    978-0-7803-9502-2
  • Electronic_ISBN
    0379-6566
  • Type

    conf

  • DOI
    10.1109/RADECS.2005.4365619
  • Filename
    4365619
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1896040