1896085

The Modeling and Characterization of Poly-Emitter n-p-n Bipolar Transistor in Bicmos Device

Hong, G.M. ; Lin, J.Y. ; Chang, K.Z. ; Lu, S.G. ; Hwang, H.L.

1993

6-7 March 1993

31

32

BiCMOS integrated circuits; Bipolar transistors; Bones; Grain boundaries; Leakage current; Radiative recombination; Semiconductor films; Silicon; Thermal resistance; Tunneling;

English

ieee

Semiconductor Modeling & Simulation, 1993. SMS Technical Digest. 1993 Symposium on

Taipei, Taiwan

0-7803-1225-2

conf

10.1109/SMS.1993.664538

664538