DocumentCode
1896190
Title
RADFET Response to Proton Irradiation Under Different Biasing Configurations
Author
Jaksic, A. ; Kimoto, Y. ; Mohammadzadeh, A. ; Hajdas, W.
Author_Institution
Tyndall Nat. Inst., Cork
fYear
2005
fDate
19-23 Sept. 2005
Abstract
Response of RADFETs manufactured at Tyndall National Institute to protons with energies of up to 60 MeV has been studied. RADFET response is compared for different biasing configurations and the effect of package lids is investigated.
Keywords
MOSFET; proton effects; RADFET; electron volt energy 60 MeV; package lids; proton irradiation; Aerospace industry; Ceramics; Electronics packaging; Electrons; Geometry; MOSFETs; Manufacturing; Monitoring; Protons; Threshold voltage; Dosimetry; RADFETs; proton response;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location
Cap d´Agde
ISSN
0379-6566
Print_ISBN
978-0-7803-9502-2
Electronic_ISBN
0379-6566
Type
conf
DOI
10.1109/RADECS.2005.4365626
Filename
4365626
Link To Document