• DocumentCode
    1896262
  • Title

    Industrial experience with cycle error computation of cycle-accurate transaction level models

  • Author

    Junghee Lee ; Joonhwan Yi

  • Author_Institution
    Telecommunication R&D Center, Samsung Electronics, Suwon City, Gyeonggi-do, Korea
  • fYear
    2007
  • fDate
    26-29 Sept. 2007
  • Firstpage
    155
  • Lastpage
    158
  • Abstract
    Transaction level modeling is gaining increasing popularity with the increasing design complexity of the system-on-a-chip. Transaction level models are frequently built from existing register transfer level models, which usually cause cycle errors. Measurable indicators of cycle errors are necessary, and their definitions are important. This paper presents the challenges in cycle error computation and our proposed method, although its effectiveness has not been proved formally. The main contribution of our study is to report an industrial experience with cycle error computation.
  • Keywords
    Communication industry; Computational modeling; Computer industry; Delay; Energy consumption; Power measurement; Software measurement; System-on-a-chip; Time measurement; Yield estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOC Conference, 2007 IEEE International
  • Conference_Location
    Hsin Chu, Taiwan
  • Print_ISBN
    978-1-4244-1592-2
  • Electronic_ISBN
    978-1-4244-1593-9
  • Type

    conf

  • DOI
    10.1109/SOCC.2007.4545448
  • Filename
    4545448