DocumentCode :
18963
Title :
Welcome to IEEE AUTOTEST 2014 [President´s Perspectives]
Author :
Zoughi, Reza ; Lyons, Robert
Volume :
17
Issue :
4
fYear :
2014
fDate :
Aug. 2014
Firstpage :
4
Lastpage :
4
Abstract :
On behalf of the IEEE Instrumentation and Measurement Society (IMS), it gives me great pleasure to welcome you to IEEE AUTOTEST 2014, being held in St. Louis, Missouri, USA, where it all started a half century ago. IEEE AUTOTEST is the focal event that brings those interested and involved in automated testing, product development, and ultimate users together under one roof. Events such as IEEE AUTOTEST are where people with the same interests and goals get together to discuss, learn, become aware of new technologies and ultimately collaborate. We are extremely happy to continue our support of IEEE AUTOTEST 2014 along with the IEEE Aerospace and Electronic Systems Society (AESS).
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2014.6873721
Filename :
6873721
Link To Document :
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