Title :
Beam profile measurement in the presence of noise
Author :
Bertsche, K. ; Palkovic, J.
Author_Institution :
Fermi Nat. Accel. Lab., Batavia, IL, USA
Abstract :
In measuring the distribution of a nominally Gaussian beam, it is generally necessary to sample the beam at a number of discrete positions. In the real world, these samples will be somewhat noisy. We present the results of simulations, showing the effects of noise in signal amplitude and noise in sample, position on the calculated beam as a function of sample spacing. This has implications for the wire spacing of multiwire profile monitors and for the sampling rate of flying wires and wall current monitors
Keywords :
particle beam diagnostics; beam profile measurement; flying wires; multiwire profile monitors; nominally Gaussian beam; signal amplitude; wall current monitors; wire spacing; Colliding beam devices; Estimation error; Laboratories; Matched filters; Noise level; Noise measurement; Position measurement; Sampling methods; Superconducting device noise; Wires;
Conference_Titel :
Particle Accelerator Conference, 1995., Proceedings of the 1995
Conference_Location :
Dallas, TX
Print_ISBN :
0-7803-2934-1
DOI :
10.1109/PAC.1995.505621
