• DocumentCode
    1896496
  • Title

    Experimentally validated circuit-simulation model of thyristor-type devices based on semiconductor physics

  • Author

    Schroder, Stefan ; Detjen, Dirk ; Kollensperger, Peter ; De Doncker, Rik W.

  • Author_Institution
    Inst. for Power Electron. & Electr. Drives, RWTH Aachen Univ., Germany
  • Volume
    1
  • fYear
    2004
  • fDate
    20-25 June 2004
  • Firstpage
    611
  • Abstract
    Accurate circuit-simulations of power-electronic circuits need precise device models. Unfortunately, all commercially available circuit simulation programs lack suitable models of high-power thyristor-type, i.e. GTO, GCT or MTO, devices. In this paper, a circuit-simulation model of thyristor-type devices is presented and evaluated. The model is based on semiconductor physics and allows transient thermal simulations. The simulation results are compared to measurements on a high-power test-bench showing excellent agreement. When the operating conditions, i.e. load current, DC-bus voltage and device temperature, are varied, excellent agreement remains between measurements and simulations. This proofs the large range of validity of these new models.
  • Keywords
    benchmark testing; circuit simulation; thyristors; GCT devices; GTO devices; MTO devices; circuit-simulation model; high-power test-bench; high-power thyristors; power-electronic circuits; semiconductor physics; thyristor-type devices; transient thermal simulations; Charge carrier processes; Circuit simulation; Circuit testing; Equations; Physics; Power electronics; Space charge; Temperature; Thyristors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Specialists Conference, 2004. PESC 04. 2004 IEEE 35th Annual
  • ISSN
    0275-9306
  • Print_ISBN
    0-7803-8399-0
  • Type

    conf

  • DOI
    10.1109/PESC.2004.1355817
  • Filename
    1355817