• DocumentCode
    1896505
  • Title

    Maintenance of serviceability of integrated circuits at radiation influence

  • Author

    Bogatyrev, Y.V. ; Korshunov, F.P. ; Lastovski, S.B. ; Turtsevich, A.S. ; Shwedov, S.V. ; Belous, A.I.

  • Author_Institution
    Sci.-Practical Mater. Res. Centre, Minsk, Belarus
  • fYear
    2012
  • fDate
    10-14 Sept. 2012
  • Firstpage
    798
  • Lastpage
    800
  • Abstract
    A number of the developed methods of maintenance of radiation resistance of integrated circuits (BiCMOS and CMOS) is submitted.
  • Keywords
    BiCMOS integrated circuits; BiCMOS; integrated circuits; radiation resistance maintenance; Annealing; BiCMOS integrated circuits; CMOS integrated circuits; CMOS technology; Maintenance engineering; Resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Telecommunication Technology (CriMiCo), 2012 22nd International Crimean Conference
  • Conference_Location
    Sevastopol, Crimea
  • Print_ISBN
    978-1-4673-1199-1
  • Type

    conf

  • Filename
    6336196
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1896505