Title :
Maintenance of serviceability of integrated circuits at radiation influence
Author :
Bogatyrev, Y.V. ; Korshunov, F.P. ; Lastovski, S.B. ; Turtsevich, A.S. ; Shwedov, S.V. ; Belous, A.I.
Author_Institution :
Sci.-Practical Mater. Res. Centre, Minsk, Belarus
Abstract :
A number of the developed methods of maintenance of radiation resistance of integrated circuits (BiCMOS and CMOS) is submitted.
Keywords :
BiCMOS integrated circuits; BiCMOS; integrated circuits; radiation resistance maintenance; Annealing; BiCMOS integrated circuits; CMOS integrated circuits; CMOS technology; Maintenance engineering; Resistance;
Conference_Titel :
Microwave and Telecommunication Technology (CriMiCo), 2012 22nd International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
978-1-4673-1199-1
