• DocumentCode
    1896515
  • Title

    Innovative electromagnetic dynamic fault current limiter operating at ambient temperature for smart grids

  • Author

    Deo, Prafulla Rajabhau ; Shah, Tushar Pritamlal

  • Author_Institution
    Innovative Technomics USA LLC, Katy, TX, USA
  • fYear
    2010
  • fDate
    19-21 Jan. 2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Design and performance of dynamic fault current limiter (DFCL) operating at ambient temperature is presented. DFCL has incremental impedance due to incremental permeability in the electromagnetic circuit of device. DFCL limits currents for first peak and also subsequent rms value of short circuit. Electro-dynamic stresses due to peak current and thermal stresses due to rms current are limited to safe values for network. Let through current is limited to within 9 kA, preventing cascade tripping but a value high enough for relay coordination. After protective devices operate and short circuit is isolated, current through DFCL reduces and DFCL instantaneously and automatically resets to low impedance. Variable impedance of DFCL ensures that even for a high impedance fault, hanging is avoided. DFCL can thermally withstand three short circuits of three seconds duration, coming in quick succession. DFCL have been fully tested and are operational in the field, with actual fault data recorded.
  • Keywords
    electric impedance; electromagnetic devices; fault current limiters; short-circuit currents; smart power grids; DFCL; ambient temperature; cascade tripping; electrodynamic stresses; electromagnetic circuit; electromagnetic dynamic fault current limiter; incremental impedance; incremental permeability; protective devices; relay coordination; rms current; smart grids; thermal stresses; variable impedance; Circuit faults; Electromagnetic devices; Fault current limiters; Impedance; Permeability; Protection; Protective relaying; Smart grids; Temperature; Thermal stresses; Fault Current Limiter; Fault currents; Network fault tolerance; Network reliability; Short circuit current; Superconducting devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Innovative Smart Grid Technologies (ISGT), 2010
  • Conference_Location
    Gaithersburg, MD
  • Print_ISBN
    978-1-4244-6264-3
  • Electronic_ISBN
    978-1-4244-6333-6
  • Type

    conf

  • DOI
    10.1109/ISGT.2010.5434734
  • Filename
    5434734