• DocumentCode
    1896597
  • Title

    STM image of polyaniline with large sum counter-ions

  • Author

    Mexiang Wan ; Chuanfeng Chu ; Yiang Yang ; Chunli Bai

  • Author_Institution
    Institute of Chemistry, Academia Sinica
  • fYear
    1994
  • fDate
    24-29 July 1994
  • Firstpage
    333
  • Lastpage
    333
  • Abstract
    Summary form only given. A very thin film of polyanfline ( PANI ) doped with p-toluenesulfonic acid was prepared by electrochemical polymerization on highly ordered pyrolylic graphite( HOPG ) substractes. The x-ray diffraction of this resulting film shows three strong diffraction at 2/spl theta/ = 9.97/spl deg/, 26.49/spl deg/ and 102.48/spl deg/, respectively, which are corresponding to periodic arrange of chain, interchain and counterions[ 1-2], respectively. A highly quality STM image of thid film was observed. The average diameter of bright dots are estimated to be 3.7/splAring/ which is consistent with the diameter of benzene rings. Therefore, we assign those bright dots as benzene rings. Moreover, the distance of the neighouring bright dots along the a diraction shown in STM image is calculated to be 8.6/spl Aring/. This is in good agreement with value of 9.07/splAring/ measured from x-ray diffraction. So, it is reasonable to assume the a diraction shown in STM image as the diraction of PANI chain. If hypotheses described above are considered and a tight interchaine contact shifted a quarter of the chain repeat unit are assumed, the distance between benzene rings along the diraction of the nearest neighuring interchain is calculated to be 6.0/splAring/. This is consistent with the measured value of 6.16/splAring/, which is the distance of the neighouring bright dots along the b diraction shown in STM image. Moreover, the angle between a and b diraction calculated based on our hypotheses is good agreement with measured value from STM image.
  • Keywords
    Moon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
  • Conference_Location
    Seoul, Korea
  • Type

    conf

  • DOI
    10.1109/STSM.1994.835397
  • Filename
    835397