Title :
Evaluation of Reliability and Data Retention of an Irradiated Nonvolatile Memory
Author :
Layton, Phil ; Longden, Larry ; Patnaude, Ed
Author_Institution :
Maxwell Technol. Inc., San Diego
Abstract :
Space systems require high reliability nonvolatile memory. This paper analyzes the reliability of an EEPROM for data retention, endurance and radiation performance across multiple die lots.
Keywords :
EPROM; radiation effects; reliability; EEPROM; data retention; endurance; multiple die lots; nonvolatile memory; radiation performance; reliability; Conducting materials; EPROM; Insulation; Logic; Nonvolatile memory; Performance analysis; Production; Silicon compounds; Space technology; Testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2005.4365649
