Title :
A prototype of a wireless-based test system
Author :
Liou, Jing-Ja ; Chih-Tsun Huang ; Wu, Cheng-Wen ; Tien, Ching-Cheng ; Wang, Chih-Hu ; Ma, Hsi-Pin ; Chen, Ying-Yen ; Hsu, Yueh-Chih ; Deng, Li-ming ; Chiu, Chien-Jung ; Li, Young-Wey ; Chang, Chieh-Ming
Author_Institution :
Department of Electrical Engineering, National Tsing Hua University, HsinChu, China
Abstract :
In this paper, we will describe a prototyping system to demonstrate a next-generation test configuration, which uniformly supports wafer test, final production test and field diagnosis. The implementation shows that we can reduce the test cost significantly by adapting a wireless-based test system.
Keywords :
Computer buffers; Decoding; Logic testing; Prototypes; Registers; System testing;
Conference_Titel :
SOC Conference, 2007 IEEE International
Conference_Location :
Hsin Chu, Taiwan
Print_ISBN :
978-1-4244-1592-2
Electronic_ISBN :
978-1-4244-1593-9
DOI :
10.1109/SOCC.2007.4545463
