• DocumentCode
    1896675
  • Title

    The Effect of Total Ionizing Dose Degradation on Laptop Hard Disks

  • Author

    Nguyen, D.N. ; Guertin, S.M. ; Patterson, J.D.

  • Author_Institution
    California Inst. of Technol., Pasadena
  • fYear
    2005
  • fDate
    19-23 Sept. 2005
  • Abstract
    A series of total ionizing dose (TID) measurements were performed on commercial hard drives to explore the possible uses of the devices for the high radiation mission, and to help the understanding of the reliability of current hard drive technology. Three different models from three major manufacturers were tested with the aid of a commercial hard drive test system.
  • Keywords
    hard discs; laptop computers; radiation effects; hard disks; laptop; reliability; total ionizing dose; Degradation; Drives; Hard disks; Magnetic heads; Magnetic materials; Portable computers; Space shuttles; System testing; Virtual manufacturing; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
  • Conference_Location
    Cap d´Agde
  • ISSN
    0379-6566
  • Print_ISBN
    978-0-7803-9502-2
  • Electronic_ISBN
    0379-6566
  • Type

    conf

  • DOI
    10.1109/RADECS.2005.4365650
  • Filename
    4365650