Title :
The Effect of Total Ionizing Dose Degradation on Laptop Hard Disks
Author :
Nguyen, D.N. ; Guertin, S.M. ; Patterson, J.D.
Author_Institution :
California Inst. of Technol., Pasadena
Abstract :
A series of total ionizing dose (TID) measurements were performed on commercial hard drives to explore the possible uses of the devices for the high radiation mission, and to help the understanding of the reliability of current hard drive technology. Three different models from three major manufacturers were tested with the aid of a commercial hard drive test system.
Keywords :
hard discs; laptop computers; radiation effects; hard disks; laptop; reliability; total ionizing dose; Degradation; Drives; Hard disks; Magnetic heads; Magnetic materials; Portable computers; Space shuttles; System testing; Virtual manufacturing; Writing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
DOI :
10.1109/RADECS.2005.4365650
