DocumentCode :
1896730
Title :
Models correlation and comparison for solder joint reliability
Author :
Xu, Y.J. ; Liang, L.H. ; Liu, Y.
Author_Institution :
Coll. of Mech. & Electron. Eng., Zhejiang Univ. of Technol., Hangzhou, China
fYear :
2005
fDate :
18-20 April 2005
Firstpage :
423
Lastpage :
429
Abstract :
In this paper, the solder joint life prediction under thermal cycling with different material constitutive relation is examined. A three-dimensional nonlinear finite element model is introduced by using the ANSYS APDL technique to be connected with the FORTRAN user defined subroutines of nonlinear material constitutive models. In addition, several other modeling related issues are explored with respect to the crack growth correlations. To better evaluate the solder joint structure integrity, a new constitutive model of the solder joint material is discussed by integrating a power law and Darveaux´s constitutive model, then the correlating material model parameters are calculated through the combination of MATLAB tool with the routines of genetic algorithms. Impact of different meshes to the solder joint reliability is also discussed. Finally, an example of solder joint failure analysis under thermal loading conditions for CSP type BGA is investigated; its fatigue life is predicted using the new material model as well as power law and Darveaux´s model. The simulation results exhibit a good correlation among different material models and test results.
Keywords :
ball grid arrays; chip scale packaging; failure analysis; finite element analysis; genetic algorithms; life testing; solders; 3D nonlinear finite element model; ANSYS APDL technique; CSP type BGA; Darveaux constitutive model; FORTRAN; MATLAB tool; crack growth correlation; failure analysis; fatigue life; genetic algorithm; nonlinear material constitutive model; power law; solder joint life prediction; solder joint material; solder joint reliability; solder joint structure integrity; thermal cycling; thermal loading; Failure analysis; Fatigue; Finite element methods; Genetic algorithms; Joining materials; MATLAB; Mathematical model; Predictive models; Soldering; Thermal loading;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
Print_ISBN :
0-7803-9062-8
Type :
conf
DOI :
10.1109/ESIME.2005.1502842
Filename :
1502842
Link To Document :
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