• DocumentCode
    1896887
  • Title

    Viscoelastic characterization of fast curing moulding compounds

  • Author

    Milosheva, B.V. ; Jansen, K.M.B. ; Janssen, J.H.J. ; Bressers, H.J.L. ; Ernst, L.J.

  • Author_Institution
    Delft Univ. of Technol., Netherlands
  • fYear
    2005
  • fDate
    18-20 April 2005
  • Firstpage
    462
  • Lastpage
    466
  • Abstract
    Thermoset resins are well known as materials for high performance applications such as in the microelectronics. Examples are moulding compounds, underfill materials, coatings, adhesives, etc. A problem is however that the curing process induces thermal and reaction shrinkage, which leads to residual stresses and warpage. The polymer behavior is highly time, temperature and cure dependent and spans the entire range from liquid to solid state during processing. In order to be able to reduce and to prevent these stresses and warpage, the compound selection and the curing procedure should be optimized within the design process. For this, the polymer material behavior should be understood in advance, which in turn requires adequate modeling and characterization during cure. This paper deals with characterization and analysis of the viscoelastic properties of underfill and molding compounds. The focus is on the determination of the most useful method to find the viscoelastic properties of fast curing materials during the cure process.
  • Keywords
    curing; moulding; polymers; thermal stress cracking; viscoelasticity; curing process; fast curing moulding compounds; polymer behavior; polymer material; residual stresses; thermoset resins; viscoelastic characterization; warpage; Coatings; Curing; Elasticity; Microelectronics; Polymers; Residual stresses; Resins; Temperature dependence; Thermal stresses; Viscosity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
  • Print_ISBN
    0-7803-9062-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2005.1502849
  • Filename
    1502849