• DocumentCode
    1896932
  • Title

    Experimental investigation of the adhesion dilation with negative thermal expansion LiAlSi2O6 fillers

  • Author

    Tsai, H.-H. ; Cheng, C.D. ; Shieh, W.B. ; Lee, K.T. ; Feng, H.P.

  • Author_Institution
    Dept. of Mech. Eng., Mingchi Univ. of Technol., Taipei, Taiwan
  • fYear
    2005
  • fDate
    18-20 April 2005
  • Firstpage
    467
  • Lastpage
    470
  • Abstract
    The bonding glue is well used in packaging of the optoelectronic elements. The light paths of the elements are aligned accurately before bonding. The coefficient of thermal expansion (CTE) of bonding glue is much more larger than the one of silicon based optoelectronic elements, the light paths of the elements are thus misaligned after the bonding. The silica filler is usually mixed into the bonding glue for lowering the CTE. In this paper, the ceramic powder of the LiAlSi2O6 with negative CTE grating is thus mixed the commercial bonding glue for deriving of the extra low dilation adhesion. The thermal expansion of the composite bonding glue with negative CTE fillers is measured accurately to compare with the filler of silica powder. The results show that a composite glue with the very low coefficient of thermal expansion is therefore acquired for packaging of optoelectronic elements.
  • Keywords
    adhesive bonding; aluminium compounds; electronics packaging; filler metals; lithium compounds; silicon compounds; thermal expansion; LiAlSi2O6; adhesion dilation; bonding glue; ceramic powder; filler; negative thermal expansion; optoelectronic elements packaging; thermal expansion coefficient; Adhesives; Bonding; Chemical elements; Curing; Optical devices; Optical mixing; Optical sensors; Packaging; Silicon compounds; Thermal expansion;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
  • Print_ISBN
    0-7803-9062-8
  • Type

    conf

  • DOI
    10.1109/ESIME.2005.1502850
  • Filename
    1502850