Numerical estimation of scattering characteristics in waveguide T-junctions with sinusoidal wedge

This paper presents the scattering properties in waveguide T-junctions with sinusoidal wedge realized by electric line currents inside the rectangular waveguide. The power transmission and reflection coefficients are calculated by using the MoM technique and compared with the results of FEM. The good agreements between two analysis methods are confirmed. First, the transmission and reflection coefficients of waveguide T-junctions as a function of wedge width are calculated. In this case, it is confirmed that the scattering properties have relatively uniform distributions. Next, the transmission and reflection coefficients of waveguide T-junctions as a function of wedge height are calculated. In this calculation, two types of sinusoidal wedges-round-shaped sinusoidal wedge and acute-shaped sinusoidal wedge-are considered. It is confirmed that the scattering properties as a function of wedge width have relatively uniform distributions, while the scattering properties as a function of wedge height do not have uniform distributions; that is, the key parameters to control the reflection and transmission are found to be the wedge height. Confirmation of this analysis model by experiments is a subject for future studies.