DocumentCode :
1897072
Title :
Latchup in ATMEL TSS902E Viterbi Decoder at Elevated Temperatures
Author :
Irom, Farokh ; Miyahira, Tetsuo F.
Author_Institution :
California Inst. of Technol., Pasadena
fYear :
2005
fDate :
19-23 Sept. 2005
Abstract :
We report Single-Event latchup results for Atmel TSS902F Viterbi decoder, which was designed on a latchup -tolerant process (based on test structure evaluation). The latchup LET threshold is below 40 MeV-cm2/mg. The saturated cross section is about 10-5 cm2.
Keywords :
CMOS integrated circuits; Viterbi decoding; radiation effects; semiconductor device reliability; Atmel TSS902F Viterbi decoder; latchup LET threshold; latchup-tolerant process; single-event latchup; Circuit testing; Decoding; Laboratories; Ocean temperature; Performance evaluation; Propulsion; Resistors; Substrates; Temperature sensors; Viterbi algorithm;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
Conference_Location :
Cap d´Agde
ISSN :
0379-6566
Print_ISBN :
978-0-7803-9502-2
Electronic_ISBN :
0379-6566
Type :
conf
DOI :
10.1109/RADECS.2005.4365666
Filename :
4365666
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1897072
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