• DocumentCode
    1897072
  • Title

    Latchup in ATMEL TSS902E Viterbi Decoder at Elevated Temperatures

  • Author

    Irom, Farokh ; Miyahira, Tetsuo F.

  • Author_Institution
    California Inst. of Technol., Pasadena
  • fYear
    2005
  • fDate
    19-23 Sept. 2005
  • Abstract
    We report Single-Event latchup results for Atmel TSS902F Viterbi decoder, which was designed on a latchup -tolerant process (based on test structure evaluation). The latchup LET threshold is below 40 MeV-cm2/mg. The saturated cross section is about 10-5 cm2.
  • Keywords
    CMOS integrated circuits; Viterbi decoding; radiation effects; semiconductor device reliability; Atmel TSS902F Viterbi decoder; latchup LET threshold; latchup-tolerant process; single-event latchup; Circuit testing; Decoding; Laboratories; Ocean temperature; Performance evaluation; Propulsion; Resistors; Substrates; Temperature sensors; Viterbi algorithm;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and Its Effects on Components and Systems, 2005. RADECS 2005. 8th European Conference on
  • Conference_Location
    Cap d´Agde
  • ISSN
    0379-6566
  • Print_ISBN
    978-0-7803-9502-2
  • Electronic_ISBN
    0379-6566
  • Type

    conf

  • DOI
    10.1109/RADECS.2005.4365666
  • Filename
    4365666
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1897072