DocumentCode :
1897287
Title :
Measurement of power consumption in graphene based logic gate for incident angle variation
Author :
Siddiquee, Tanvir Ahamed ; Labib ; Hassan, Asif ; Nandy, Turja ; Dutta, Aurin ; Abedin, Minhaz Ibna
Author_Institution :
Khulna Univ. of Eng. & Technol., Khulna, Bangladesh
fYear :
2015
fDate :
5-7 March 2015
Firstpage :
1
Lastpage :
5
Abstract :
Graphene is assumed that it can be used in analog electronics because of its extraordinary electronic features. But nowadays it is investigated in digital logic gates due to the tunability of Fermi energy level. For making a promising logic gate, graphene is now exercised in correlation with the using of optics law. Transport properties in a doped graphene are extensively determined by measurement of incident angle. From which an important property of a device like “resistance of interface” can be extracted. Moreover, width of the graphene is one of the issues to be thought. By minimizing resistance of interface and maximizing the width of graphene, considerable power consumption can also be determined. In this paper, we will observe the electron transmission probability depending on the variation of incident angle of light of an interface. Then, we will calculate the resistance of interface. We will investigate the ambipolar characteristics by observing dc conductivity of graphene. At last, we will measure the power consumption of the device by tradeoff between the resistance and width of graphene.
Keywords :
Fermi level; graphene devices; integrated circuit measurement; logic gates; low-power electronics; probability; Fermi energy level; analog electronics; digital logic gates; electron transmission probability; graphene based logic gate; incident angle measurement; incident angle variation; interface resistance; optics law; power consumption measurement; Atom optics; Conductivity; Conductivity measurement; Graphene; Lead; Logic gates; Optical variables measurement; Graphene; dc conductivity; electron transmission probability; power consumption; resistance of interface;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical, Computer and Communication Technologies (ICECCT), 2015 IEEE International Conference on
Conference_Location :
Coimbatore
Print_ISBN :
978-1-4799-6084-2
Type :
conf
DOI :
10.1109/ICECCT.2015.7225949
Filename :
7225949
Link To Document :
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