• DocumentCode
    1897442
  • Title

    High performance screen-printable silicone as selective hybrid IC encapsulant

  • Author

    Wong, C.P.

  • Author_Institution
    AT&T Bell Lab., Princeton, NJ, USA
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    606
  • Abstract
    An excellent solvent-, flux-, and detergent-resistant screen-printable silicone (SPS) with a modest curing temperature and excellent adhesion to gold-plated substrate has been developed. The author describes the material formulation of and the need for an encapsulant with the above properties. Microdielectrometry was used to define the precise SPS cure schedule; temperature-humidity-bias was used to qualify the material´s electrical performance; Auger spectroscopy and laser ionization mass spectrometry were used to further elucidate the crosslinking density and the interfacial interaction of the SPS and the encapsulated substrate. The high crosslinking density resulting from the addition of an aminosilane and high filler (fused silica) loading were shown to be the keys to a solvent-resistant silicon formulation
  • Keywords
    Auger effect; encapsulation; hybrid integrated circuits; mass spectrometer applications; silicones; Auger spectroscopy; adhesion; aminosilane; crosslinking density; cure schedule; curing temperature; electrical performance; filler; interfacial interaction; laser ionization mass spectrometry; material formulation; microdielectrometry; screen-printable silicone; selective hybrid IC encapsulant; temperature-humidity-bias; Adhesives; Electric resistance; Encapsulation; Hybrid integrated circuits; Mass spectroscopy; Optical materials; Protection; Purification; Solvents; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122250
  • Filename
    122250