Title :
Analytical solutions for two-dimensional heat spread in ASICs using conformal mapping techniques
Author :
Augustin, Adam ; Kostka, Arno ; Maj, Bartosz
Author_Institution :
Solid State Electron. Lab., Tech. Univ. of Darmstadt, Germany
Abstract :
The subject of this work is the calculation of the temperature distribution in ASICs, generated by rectangular sources at the top surface of the ASIC while the backside of the substrate is held at a fixed temperature. Using conformal mapping, the steady state temperature distribution generated by surface sources of variable width in ASICs of variable thickness is calculated. Conformal mapping theory, especially the Schwarz-Christoffel transformation, is used to transform the given structure into simpler topology so that the solution of the heat equation becomes much easier and allows the use of given solutions, e.g. for symmetrical structures. Additionally, methods are shown on how to obtain transformations that can be inverted analytically, so that all results appear in closed-form elementary functions containing the geometry parameters. Furthermore, some hints are given, how a multitude of thermal problems can be solved using the conformal mapping method. Finally, the results are compared with ANSYS simulations for the verification of the two approaches.
Keywords :
application specific integrated circuits; conformal mapping; differential equations; equations of state; heat transfer; network analysis; reliability; temperature distribution; thermal management (packaging); 2D heat spread; ANSYS simulations; ASIC; Schwarz-Christoffel transformation; conformal mapping; heat equation; temperature distribution; Amplitude shift keying; Application specific integrated circuits; Conformal mapping; Control systems; Geometry; Heat sinks; Laplace equations; Silicon; Solid state circuits; Temperature distribution;
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Micro-Electronics and Micro-Systems, 2005. EuroSimE 2005. Proceedings of the 6th International Conference on
Print_ISBN :
0-7803-9062-8
DOI :
10.1109/ESIME.2005.1502872