DocumentCode

1898130

Title

Scanning tunneling microscopy of TTF-TCNQ single crystal and thin film

Author

Ara, N. ; Yase, K. ; Shigekawa, H. ; Yoshimura, Masashi ; Kawazu, A.

Author_Institution

The Univ. of Tokyo

fYear

1994

fDate

24-29 July 1994

Firstpage

367

Lastpage

367

Keywords

Crystals; Current measurement; Insulation; Metal-insulator structures; Microscopy; Sputtering; Temperature; Transistors; Tunneling; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on

Conference_Location

Seoul, Korea

Type

conf

DOI

10.1109/STSM.1994.835465

Filename

835465