DocumentCode :
1898130
Title :
Scanning tunneling microscopy of TTF-TCNQ single crystal and thin film
Author :
Ara, N. ; Yase, K. ; Shigekawa, H. ; Yoshimura, Masashi ; Kawazu, A.
Author_Institution :
The Univ. of Tokyo
fYear :
1994
fDate :
24-29 July 1994
Firstpage :
367
Lastpage :
367
Keywords :
Crystals; Current measurement; Insulation; Metal-insulator structures; Microscopy; Sputtering; Temperature; Transistors; Tunneling; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
Conference_Location :
Seoul, Korea
Type :
conf
DOI :
10.1109/STSM.1994.835465
Filename :
835465
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1898130
