Title :
Diagnostic experiments to measure frequency and alpha for rectangular cross section gyrotrons
Author :
Jaynes, R.L. ; Gilgenbach, R.M. ; Hochman, J.M. ; Rintamaki, J.J. ; Lau, Y.Y. ; Spencer, T.A.
Author_Institution :
Dept. of Nucl. Eng. & Radiol. Sci., Michigan Univ., Ann Arbor, MI, USA
Abstract :
Summary form only given, as follows. Comparisons of microwave frequency and electron beam alpha (Vperp/Vparallel) measurements to gyrotron dispersion relations are investigated. Alpha measurements are obtained by measuring radiation darkening patterns of glass plates. Frequencies are determined to within 500 MHz using microstrip microwave frequency filters. More accurate frequency measurements are taken using heterodyne detection. Frequency and alpha measurements are essential for determining the mode of operation of the rectangular cross section (RCS) gyrotron. The RCS gyrotron can be operated from 2-4 GHz in either the TE10 and TE01 modes. The relativistic electron beam is generated by MELBA (Michigan electron long beam accelerator) with the following operating parameters: -800 kV, 1-10 kA diode current, 0.2-0.5 kA tube current, 0.5-1.0 /spl mu/s pulselength.
Keywords :
dispersion relations; electron tube testing; frequency measurement; gyrotrons; microstrip filters; microwave filters; microwave generation; microwave measurement; microwave tubes; relativistic electron beam tubes; 0.2 to 0.5 kA; 0.5 to 1 mus; 2 to 4 GHz; 500 MHz; 800 kV; MELBA; Michigan electron long beam accelerator; TE01 modes; TE10 modes; alpha measurements; diode current; electron beam alpha; frequency measurements; glass plates; gyrotron dispersion relations; heterodyne detection; microstrip microwave frequency filters; microwave frequency; mode of operation; pulselength; radiation darkening patterns; rectangular cross section gyrotrons; relativistic electron beam; tube current; Dispersion; Electron beams; Frequency measurement; Glass; Gyrotrons; Microstrip filters; Microwave filters; Microwave frequencies; Microwave measurements; Pulse generation;
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-3990-8
DOI :
10.1109/PLASMA.1997.605003
