Title :
A 1k-pixel 3D CMOS sensor
Author :
van der Tempel, W. ; Grootjans, Riemer ; Van Nieuwenhove, Daniel ; Kuijk, Maarten
Author_Institution :
Dept. of Electron. & Inf. (ETRO), Vrije Univ. Brussel, Brussel
Abstract :
A solid-state three-dimensional Time-of-Flight sensor is presented consisting of 32 times 32 range pixels based on Current-Assisted Photonic Demodulation (CAPD). Each pixel measures 30 mum times 30 mum and consists of 6 transistors and a differential current-assisted photonic demodulator, yielding a Fill-Factor of 66%. The sensor is implemented in 0.35 m standard CMOS technology without optical optimization steps, while still achieving a 0.2 A/W responisivity at 870 nm. Range-finding is achieved through Modulated Wave Time-of-Flight using a modulation frequency of 20 MHz. The range performance of this sensor is discussed and TOF measurements of a prototype camera-system using this sensor are presented.
Keywords :
CMOS image sensors; demodulation; 3D CMOS sensor; CMOS technology; differential current assisted photonic demodulator; fill factor; frequency 20 MHz; prototype camera system; time-of-flight sensor; transistors; wavelength 870 nm; CMOS technology; Delay; Demodulation; Frequency modulation; Layout; Optical filters; Optical modulation; Optical sensors; Optoelectronic and photonic sensors; Voltage;
Conference_Titel :
Sensors, 2008 IEEE
Conference_Location :
Lecce
Print_ISBN :
978-1-4244-2580-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2008.4716611