DocumentCode :
1898654
Title :
A resource-efficient probabilistic fault simulator
Author :
May, Dominik ; Stechele, Walter
Author_Institution :
Inst. for Integrated Syst., Tech. Univ. Munchen, München, Germany
fYear :
2013
fDate :
2-4 Sept. 2013
Firstpage :
1
Lastpage :
4
Abstract :
The reduction of CMOS structures into the nanometer regime, as well as the high demand for low-power applications, animating to further reduce the supply voltages towards the threshold, results in an increased susceptibility of integrated circuits to soft errors. Hence, circuit reliability has become a major concern in today´s VLSI design process. A new approach to further support these trends is to relax the reliability requirements of a circuit, while ensuring that the functionality of the circuit remains unaffected, or effects remain unnoticed by the user. To realize such an approach it is necessary to determine the probability of an error at the output of a circuit, given an error probability distribution at the circuits´ elements. Purely software-based simulation approaches are unsuitable due to the large simulation times. Hardware-accelerated approaches exist, but lack the ability to inject errors based on probabilities, are slow or have a large area overhead. In this paper we propose a novel approach for FPGA-based, probabilistic, circuit fault simulation. The proposed system is a mainly hardware-based, which makes the simulation fast, but also keeps the hardware overhead on the FPGA low by exploiting FPGA specific features.
Keywords :
CMOS integrated circuits; circuit simulation; error statistics; field programmable gate arrays; integrated circuit reliability; statistical distributions; CMOS structure reduction; FPGA; VLSI design process; circuit elements; circuit reliability; error probability distribution; low-power applications; nanometer regime; probabilistic circuit fault simulation; resource-efficient probabilistic fault simulator; software-based simulation approach; supply voltages; Circuit faults; Clocks; Error probability; Field programmable gate arrays; Generators; Integrated circuit modeling; Probabilistic logic;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Field Programmable Logic and Applications (FPL), 2013 23rd International Conference on
Conference_Location :
Porto
Type :
conf
DOI :
10.1109/FPL.2013.6645581
Filename :
6645581
Link To Document :
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