• DocumentCode
    1898687
  • Title

    Thermal Noise Effect in FTTH Communication Systems

  • Author

    Ab-Rahman, Mohammad Syuhaimi ; Ibrahim, Mohd Faisal ; Rahni, Ashrani A Abd

  • Author_Institution
    Univ. Kebangsaan Malaysia, Bangi
  • fYear
    2008
  • fDate
    8-13 June 2008
  • Firstpage
    364
  • Lastpage
    370
  • Abstract
    Thermal noise is generated naturally by thermal agitation of electrons in a conductor commonly found in opto-electronic devices. The fact that the optical medium is totally immune to noise does not exclude its occurrence in receiver parts. In communication, thermal noise has a major influence to the quality of the receiver. The lower the thermal noise the higher and more expensive is receiver sensitivity. This paper starts with a tutorial on thermal noise in common communication technologies. The major contribution factor to thermal noise power is also discussed analytically. For more comprehensive view, the includes a study on thermal noise effects network performance in terms of BER, maximum Q-factor, eye height and maximum distance. The fiber-to-the-home network is used as a test field to study the impact of two different values of thermal noise on network parameters. At the end of this paper, thermal noise minimizing techniques are also listed.
  • Keywords
    Q-factor; error statistics; optical fibre communication; optoelectronic devices; thermal noise; BER; FTTH communication systems; eye height; fiber-to-the-home network; maximum Q-factor; maximum distance; opto-electronic devices; receiver sensitivity; thermal agitation; thermal noise effect; Communications technology; Conductors; Electron optics; Noise generators; Optical fiber subscriber loops; Optical noise; Optical receivers; Optical sensors; Optoelectronic devices; Thermal conductivity; Thermal noise; fiber-to-the-home; maximum distance; performance parameter; sensitivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Telecommunications, 2008. AICT '08. Fourth Advanced International Conference on
  • Conference_Location
    Athens
  • Print_ISBN
    978-0-7695-3162-5
  • Electronic_ISBN
    978-0-7695-3162-5
  • Type

    conf

  • DOI
    10.1109/AICT.2008.71
  • Filename
    4545557