Title :
Sensitivity tunable capacitive type micro accelerometer
Author :
Je, Chang Han ; Lee, Sungsik ; Lee, Myung Lae ; Jung, Sunghae ; Lee, Ahra ; Hwang, Gunn ; Yu, Byoung Gon ; Choi, Chang Auck
Author_Institution :
Convergence Component & Mater. Res. Lab., Electron. & Telecommun. Res. Inst. (ETRI), Daejeon
Abstract :
In this paper, we present a novel sensitivity tunable capacitive type micro accelerometer which could adjust its sensitivity. The previous bulk-micromachined accelerometer is hard to make a pattern which is smaller than 1 um with high aspect ratio because of ICP etching errors such as loading effect and footing. In this paper, by making movable ground electrodes which have MEMS actuators, we present a high sensitivity micro accelerometer with a narrow sensing gap under 1 um using conventional bulk micromachining. Unlike previous capacitive type MEMS accelerometers which have anchored ground electrodes, the proposed micro accelerometer has movable ground electrodes. By simply applying DC bias to MEMS actuators, the ground electrodes are moved to the sensing electrodes. The fabricated sensing gap is 1.9 um and it could be reduced to 0.8 um according to the actuation voltage, VDD. The working sensitivity of the micro accelerometer is 0.410 pF/g at VDD=1.0 V, which is higher than 0.125 pF/g with no actuation, VDD=0 V.
Keywords :
accelerometers; earth electrodes; microactuators; MEMS actuators; bulk-micromachined accelerometer; high sensitivity micro accelerometer; movable ground electrodes; narrow sensing gap; sensitivity tunable capacitive type microaccelerometer; Acceleration; Accelerometers; Capacitance; Electrodes; Electrostatic actuators; Force sensors; Gunn devices; Micromachining; Micromechanical devices; Springs;
Conference_Titel :
Sensors, 2008 IEEE
Conference_Location :
Lecce
Print_ISBN :
978-1-4244-2580-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2008.4716616