DocumentCode :
1898810
Title :
A differential-height-mesa buried body tie SOI process
Author :
Woodruff, R.L. ; Tyson, S.M. ; Yawger, R.R.
Author_Institution :
United Technol. Microelectron. Center, Colorado Springs, CO, USA
fYear :
1991
fDate :
1-3 Oct 1991
Firstpage :
148
Lastpage :
149
Abstract :
A low-area penalty method of contacting the floating body of thin-film SOI (silicon-on-insulator) devices has been devised. By contacting the otherwise floating body, its potential can be fixed and the well-documented issues of bipolar snapback and kink arising from impact ionization may be mostly or entirely mitigated. This body tie is fabricated under a conventional LOCOS field isolation structure. An added benefit of this process approach is that mesas of different thicknesses may be readily fabricated so that a mixture of fully depleted and partially depleted transistors can be built on a common substrate simultaneously
Keywords :
semiconductor technology; semiconductor-insulator boundaries; SOI process; buried body tie; common substrate; conventional LOCOS field isolation structure; differential-height-mesa; floating body tie; impact ionization; kink elimination; low-area penalty method; partially depleted transistors; snapback elimination; Bidirectional control; Impact ionization; Microelectronics; Oxidation; Random access memory; Silicon; Springs; Substrates; Thin film devices; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SOI Conference, 1991. Proceedings, 1991., IEEE International
Conference_Location :
Vail Valley, CO
Print_ISBN :
0-7803-0184-6
Type :
conf
DOI :
10.1109/SOI.1991.162900
Filename :
162900
Link To Document :
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