• DocumentCode
    1898810
  • Title

    A differential-height-mesa buried body tie SOI process

  • Author

    Woodruff, R.L. ; Tyson, S.M. ; Yawger, R.R.

  • Author_Institution
    United Technol. Microelectron. Center, Colorado Springs, CO, USA
  • fYear
    1991
  • fDate
    1-3 Oct 1991
  • Firstpage
    148
  • Lastpage
    149
  • Abstract
    A low-area penalty method of contacting the floating body of thin-film SOI (silicon-on-insulator) devices has been devised. By contacting the otherwise floating body, its potential can be fixed and the well-documented issues of bipolar snapback and kink arising from impact ionization may be mostly or entirely mitigated. This body tie is fabricated under a conventional LOCOS field isolation structure. An added benefit of this process approach is that mesas of different thicknesses may be readily fabricated so that a mixture of fully depleted and partially depleted transistors can be built on a common substrate simultaneously
  • Keywords
    semiconductor technology; semiconductor-insulator boundaries; SOI process; buried body tie; common substrate; conventional LOCOS field isolation structure; differential-height-mesa; floating body tie; impact ionization; kink elimination; low-area penalty method; partially depleted transistors; snapback elimination; Bidirectional control; Impact ionization; Microelectronics; Oxidation; Random access memory; Silicon; Springs; Substrates; Thin film devices; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 1991. Proceedings, 1991., IEEE International
  • Conference_Location
    Vail Valley, CO
  • Print_ISBN
    0-7803-0184-6
  • Type

    conf

  • DOI
    10.1109/SOI.1991.162900
  • Filename
    162900