DocumentCode :
1899440
Title :
Analytic investigation of the transit-time instability including intense space charge effects
Author :
Luginsland, J.W. ; Arman, M.J. ; Lau, Y.Y.
Author_Institution :
Phillips Lab., Kirtland AFB, NM, USA
fYear :
1997
fDate :
19-22 May 1997
Firstpage :
254
Abstract :
Summary form only given, as follows. A circuit model is used to investigate the transit-time instability (TTI). Although it has been known since the 1930´s, recent efforts to develop a High-Power microwave (HPM) source using the TTI have focused on using modern pulsed-power technology to create high current (10´s of kAmp) beams to drive the source. It is well known that the space charge associated with intense beams can severely complicate the analysis of HPM devices. This circuit model clarifies the role of space charge in the transit-time instability. Application of the model to the Radial Acceletron, currently being investigated at Phillips Laboratory, yields an analytic expression of the starting condition for microwave oscillations. Numerical solution of the governing equations gives growth rates, saturation levels, and elucidates the saturation mechanism in the presence of space charge. These results are consistent with full Particle-in-Cell simulations of the device.
Keywords :
circuit analysis computing; microwave generation; microwave oscillators; microwave tubes; numerical analysis; pulsed power technology; space charge; starting; HPM devices; Phillips Laboratory; Radial Acceletron; circuit model; governing equations; growth rates; high current beams; high-power microwave source; intense space charge effects; microwave oscillations; numerical solution; particle-in-cell simulations; pulsed-power technology; saturation levels; saturation mechanism; space charge; starting condition; transit-time instability; Circuits; Computational modeling; Electrons; Laboratories; Microwave devices; Microwave technology; Optical reflection; Q factor; Resonance; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3990-8
Type :
conf
DOI :
10.1109/PLASMA.1997.605007
Filename :
605007
Link To Document :
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