• DocumentCode
    1899696
  • Title

    Automatic optical inspection (AOI)

  • Author

    Hecht, Oded ; Dishon, Giora

  • Author_Institution
    Orbot Inc., Woburn, MA, USA
  • fYear
    1990
  • fDate
    20-23 May 1990
  • Firstpage
    659
  • Abstract
    The benefits of AOI are described, and an overview and technological tradeoffs of the AOI of the thin-film microchip module (TFMCM) are presented. It is noted that AOI has been proven to be essential in the production of electronic products such as printed circuit boards (PCBs) and photomasks. Because the structure and the production process of TF MCMs resemble those of these products, AOI is very likely to become imperative in the manufacturing process of multichip modules (MCMs). AOI technology is based on sophisticated image-processing techniques using advanced software algorithms with state-of-the-art hardware. Therefore, the investment in such equipment is large and requires deep understanding for cost justification, and the selection among competing vendors is hard to make. The continuous introduction of new models and improvements further amplifies the need to carefully consider the choice, ensuring that the equipment will keep up with the process and produce the best results for a long period
  • Keywords
    automatic optical inspection; modules; packaging; printed circuit testing; AOI; cost justification; image-processing techniques; multichip modules; photomasks; printed circuit boards; thin-film microchip module; Automatic optical inspection; Costs; Hardware; Investments; Manufacturing processes; Multichip modules; Printed circuits; Production; Software algorithms; Thin film circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 1990. ., 40th
  • Conference_Location
    Las Vegas, NV
  • Type

    conf

  • DOI
    10.1109/ECTC.1990.122259
  • Filename
    122259