DocumentCode :
1899696
Title :
Automatic optical inspection (AOI)
Author :
Hecht, Oded ; Dishon, Giora
Author_Institution :
Orbot Inc., Woburn, MA, USA
fYear :
1990
fDate :
20-23 May 1990
Firstpage :
659
Abstract :
The benefits of AOI are described, and an overview and technological tradeoffs of the AOI of the thin-film microchip module (TFMCM) are presented. It is noted that AOI has been proven to be essential in the production of electronic products such as printed circuit boards (PCBs) and photomasks. Because the structure and the production process of TF MCMs resemble those of these products, AOI is very likely to become imperative in the manufacturing process of multichip modules (MCMs). AOI technology is based on sophisticated image-processing techniques using advanced software algorithms with state-of-the-art hardware. Therefore, the investment in such equipment is large and requires deep understanding for cost justification, and the selection among competing vendors is hard to make. The continuous introduction of new models and improvements further amplifies the need to carefully consider the choice, ensuring that the equipment will keep up with the process and produce the best results for a long period
Keywords :
automatic optical inspection; modules; packaging; printed circuit testing; AOI; cost justification; image-processing techniques; multichip modules; photomasks; printed circuit boards; thin-film microchip module; Automatic optical inspection; Costs; Hardware; Investments; Manufacturing processes; Multichip modules; Printed circuits; Production; Software algorithms; Thin film circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location :
Las Vegas, NV
Type :
conf
DOI :
10.1109/ECTC.1990.122259
Filename :
122259
Link To Document :
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