DocumentCode :
189991
Title :
A bridge-type resistive temperature sensor in CMOS technology with low stress sensitivity
Author :
Huber, Samuel ; Laville, Arnaud ; Schott, Christian ; Paul, Oliver
Author_Institution :
Melexis Technol. SA, Bevaix, Switzerland
fYear :
2014
fDate :
2-5 Nov. 2014
Firstpage :
1455
Lastpage :
1458
Abstract :
CMOS resistive and bipolar temperature sensors are sensitive to mechanical stress via the piezoresistance and piezojunction effects. In this paper we present a CMOS compatible temperature sensor with differential output and low stress sensitivity. The sensor is based on 16 appropriately arranged p-well and p-poly resistors combined in a Wheatstone bridge in such a way as to provide isotropic piezoresistance for the sum of in-plane normal stress and to compensate the junction field effect. At room temperature the sensitivities with respect to temperature and stress were found to be 3.9mV/K and -29 uV /MPa, respectively. Hence, the sensor experiences a stress-related error as small as -0.0074K/MPa. In contrast to conventional bipolar approaches our sensor does not require any circuitry. Moreover, it can be placed easily at the desired location on the chip thanks to its small size of 61um × 61 um.
Keywords :
CMOS integrated circuits; bridge circuits; piezoresistance; piezoresistive devices; resistors; temperature sensors; CMOS compatible temperature sensor; Wheatstone bridge; bipolar temperature sensor; bridge-type resistive temperature sensor; in-plane normal stress; isotropic piezoresistance; junction field effect compensation; low stress sensitivity; mechanical stress; p-poly resistor; p-well resistor; piezojunction effect; piezoresistance effect; stress-related error; temperature 293 K to 298 K; Bridge circuits; CMOS integrated circuits; Piezoresistance; Resistors; Sensitivity; Stress; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SENSORS, 2014 IEEE
Conference_Location :
Valencia
Type :
conf
DOI :
10.1109/ICSENS.2014.6985288
Filename :
6985288
Link To Document :
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