Title :
Field propagation effects and related multibunch instability in multicell capture cavities
Author :
Ferrario, M. ; Mosnier, A. ; Serafini, Luciano ; Tazzioli, F. ; Tessier, J.-M.
Author_Institution :
Infn, Frascati, Italy
Abstract :
Field propagation effects during the filling and re-filling of the cavity are not harmful for a relativistic beam accelerated in a multicell standing wave cavity. On the opposite the beam dynamics of a non relativistic beam injected into a capture cavity can be significantly affected by the interaction with other modes of the fundamental passband, under beam-loading conditions. In fact, the dominant beating provided by the passband mode nearest to the accelerating n-mode introduces fluctuations on the accelerating voltage. The phase slippage occurring in the first cells, between the non relativistic beam and the lower modes, produces an effective enhancement of the shunt impedances, which are usually negligible for a relativistic beam in a well tuned cavity. In some cases simulations show a significant oscillation of the energy spread and transverse normalized emittance along the bunch train. As an example, we have applied our computational models to the beam-loading problem in the Tesla Test Facility (TTF) superconducting capture cavity
Keywords :
accelerator cavities; beam handling techniques; electric impedance; particle beam dynamics; particle beam stability; superconducting cavity resonators; Tesla Test Facility superconducting capture cavity; accelerating n-mode; beam-loading conditions; field propagation effects; fundamental passband; multibunch instability; multicell capture cavities; multicell standing wave cavity; passband mode; relativistic beam; shunt impedances; transverse normalized emittance; Acceleration; Computational modeling; Differential equations; Filling; Fluctuations; Particle beams; Passband; Radio frequency; Space charge; Voltage;
Conference_Titel :
Particle Accelerator Conference, 1995., Proceedings of the 1995
Conference_Location :
Dallas, TX
Print_ISBN :
0-7803-2934-1
DOI :
10.1109/PAC.1995.505796