Title :
Electron Beam Sensitive Devices Design Methods
Author :
Micollet, D. ; Courtois, B.
Author_Institution :
COMPUTER ARCHITECTURE GROUP, IMAG/TIM3, 46 Avenue Félix VIALLET, 38031 GRENOBLE Cedex - FRANCE
Abstract :
two methods are detailled for the design of e- beam sensitive devices for controlability.
Keywords :
Computer architecture; Design automation; Design methodology; Electron beams; Integrated circuit testing; Inverters; MOS devices; Observability; Polarization; Voltage;
Conference_Titel :
Solid-state Circuits Conference, 1987. ESSCIRC '87. 13th European
Conference_Location :
Taunus-Tagungs-Zentrum, F.R. Germany