Part 3: Off Chip Communication and Testing

Author

Schettler, Helmut

fYear

1981

fDate

22-24 Sept. 1981

Firstpage

156

Lastpage

158

Keywords

Circuit testing; Delay; Driver circuits; Impedance; Logic testing; Packaging; Read-write memory; Switches; Switching circuits; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid State Circuits Conference, 1981. ESSCIRC '81. 7th European

Conference_Location

Freiburg, F. R. Germany

Print_ISBN

3800712385

Type

Filename

5434988

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