Title :
Structural studies of Langmuir and Langmuir-Blodgett films of a functionalized molecule with cross-sectional mismatch between head and tail
Author :
Bjornholm, T. ; Larsen, N.B. ; Garnaes, J. ; Kjaer, K.
Author_Institution :
University of Copenhagen
Keywords :
Atomic force microscopy; Atomic layer deposition; Atomic measurements; Chemistry; Laboratories; Metrology; Physics; Solid state circuits; Tail;
Conference_Titel :
Science and Technology of Synthetic Metals, 1994. ICSM '94. International Conference on
Conference_Location :
Seoul, Korea
DOI :
10.1109/STSM.1994.835614
