DocumentCode :
1901415
Title :
Onboard condition monitoring of solder fatigue in IGBT power modules
Author :
Ji, Baojian ; Pickert, Volker ; Cao, W.P. ; Xing, Liudong
Author_Institution :
Sch. of Electr. & Electron. Eng., Newcastle Univ., Newcastle upon Tyne, UK
fYear :
2013
fDate :
27-30 Aug. 2013
Firstpage :
9
Lastpage :
15
Abstract :
This paper proposes a novel on-board condition monitoring of the aging of solder layers in IGBTs for electric vehicle applications. The diagnostic technique makes use of the chip itself as a temperature sensor while current sensors are already in place for control purposes. An auxiliary power supply unit which can be created from the 12V battery and an in situ data-logger circuit is developed for condition monitoring. The novel aspect of the proposed technique relates to monitoring IGBTs in situ when the electric vehicle is operating during stop-and-go traffic conditions or at routine services. The accelerated aging tests are performed on the test vehicles and the condition monitoring system is validated using simulation and thermo-electrical experimentation. The thermal performance of the thermal resistance/impedance and junction temperature of the IGBTs demonstrates the effectiveness of the proposed technique for IGBT health monitoring.
Keywords :
ageing; condition monitoring; data loggers; electric sensing devices; electric vehicles; insulated gate bipolar transistors; life testing; semiconductor device reliability; solders; temperature sensors; thermal management (packaging); traction motor drives; IGBT power modules; accelerated aging tests; condition monitoring; data-logger circuit; electric vehicle applications; insulated gate bipolar transistors; on-board diagnostic prognostic; semiconductor device reliability; solder fatigue; thermal management; thermo-electrical experimentation; traction motor drive; Condition monitoring; Fatigue; Heating; Insulated gate bipolar transistors; Loss measurement; Temperature measurement; Thermal resistance; Monitoring insulated gate bipolar transistors; power electronics; prognostics and health management; semiconductor device reliability; thermal management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED), 2013 9th IEEE International Symposium on
Conference_Location :
Valencia
Type :
conf
DOI :
10.1109/DEMPED.2013.6645690
Filename :
6645690
Link To Document :
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