• DocumentCode
    1901415
  • Title

    Onboard condition monitoring of solder fatigue in IGBT power modules

  • Author

    Ji, Baojian ; Pickert, Volker ; Cao, W.P. ; Xing, Liudong

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Newcastle Univ., Newcastle upon Tyne, UK
  • fYear
    2013
  • fDate
    27-30 Aug. 2013
  • Firstpage
    9
  • Lastpage
    15
  • Abstract
    This paper proposes a novel on-board condition monitoring of the aging of solder layers in IGBTs for electric vehicle applications. The diagnostic technique makes use of the chip itself as a temperature sensor while current sensors are already in place for control purposes. An auxiliary power supply unit which can be created from the 12V battery and an in situ data-logger circuit is developed for condition monitoring. The novel aspect of the proposed technique relates to monitoring IGBTs in situ when the electric vehicle is operating during stop-and-go traffic conditions or at routine services. The accelerated aging tests are performed on the test vehicles and the condition monitoring system is validated using simulation and thermo-electrical experimentation. The thermal performance of the thermal resistance/impedance and junction temperature of the IGBTs demonstrates the effectiveness of the proposed technique for IGBT health monitoring.
  • Keywords
    ageing; condition monitoring; data loggers; electric sensing devices; electric vehicles; insulated gate bipolar transistors; life testing; semiconductor device reliability; solders; temperature sensors; thermal management (packaging); traction motor drives; IGBT power modules; accelerated aging tests; condition monitoring; data-logger circuit; electric vehicle applications; insulated gate bipolar transistors; on-board diagnostic prognostic; semiconductor device reliability; solder fatigue; thermal management; thermo-electrical experimentation; traction motor drive; Condition monitoring; Fatigue; Heating; Insulated gate bipolar transistors; Loss measurement; Temperature measurement; Thermal resistance; Monitoring insulated gate bipolar transistors; power electronics; prognostics and health management; semiconductor device reliability; thermal management;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Diagnostics for Electric Machines, Power Electronics and Drives (SDEMPED), 2013 9th IEEE International Symposium on
  • Conference_Location
    Valencia
  • Type

    conf

  • DOI
    10.1109/DEMPED.2013.6645690
  • Filename
    6645690