DocumentCode :
19016
Title :
High Temperature Characteristics of GaN-Based Inverter Integrated With Enhancement-Mode (E-Mode) MOSFET and Depletion-Mode (D-Mode) HEMT
Author :
Zhe Xu ; Jinyan Wang ; Yong Cai ; Jingqian Liu ; Zhen Yang ; Xiaoping Li ; Maojun Wang ; Min Yu ; Bing Xie ; Wengang Wu ; Xiaohua Ma ; Jincheng Zhang ; Yue Hao
Author_Institution :
Inst. of Microelectron., Peking Univ., Beijing, China
Volume :
35
Issue :
1
fYear :
2014
fDate :
Jan. 2014
Firstpage :
33
Lastpage :
35
Abstract :
High temperature characteristics of GaN-based inverter is presented from room temperature (RT) to 300 °C, which is integrated with enhancement-mode MOSFET and depletion-mode HEMT. At 300 °C, the fabricated inverter operates properly at a supply voltage (VDD) of 7 V with 6.5 V for logic voltage swing, 3.3 V for threshold voltage (VTH), 2.4 V for logic-low noise margin (NML), and 3.4 V for logic-high noise margin (NMH). Meanwhile, the inverter exhibits small variations from RT to 300 °C in terms of logic voltage swing, VTH, NML, and NMH with the maximum relative variations of 2.2%, 5.7%, 12.9%, and 4.9% in such temperature range, respectively.
Keywords :
III-V semiconductors; MOSFET; gallium compounds; high electron mobility transistors; logic circuits; logic gates; wide band gap semiconductors; D-mode HEMT; E-mode MOSFET; GaN; RT; depletion-mode HEMT; enhancement-mode MOSFET; high temperature characteristics; inverter; logic voltage swing; logic-high noise margin; logic-low noise margin; temperature 293 K to 298 K; temperature 300 degC; voltage 2.4 V; voltage 3.3 V; voltage 3.4 V; voltage 6.5 V; voltage 7 V; Gallium nitride; HEMTs; Inverters; Logic gates; MOSFET; Temperature; Threshold voltage; DCFL; GaN; inverter; small variations;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2013.2291854
Filename :
6680671
Link To Document :
بازگشت