Impurity growth in single bunch operation of PF

Author

Tobiyama, M. ; Higuchi, A. ; Mitsuhashi, T. ; Kasuga, T. ; Sakanaka, S.

Author_Institution

Nat. Lab. for High Energy Phys., Tsukuba, Japan

Volume

5

fYear

1995

fDate

1-5 May 1995

Firstpage

3300

Abstract

Growth of the single bunch impurity was observed in the Photon Factory storage ring. The phenomenon caused by recapture of electrons that are thrown out of main bucket by Touschck effect was analyzed theoretically. Agreement of the observed rate of the impurity growth and the theoretical estimation was fairly well. In order to cure the effect, the RF knockout method was employed. The betatron tune of a bunch depends on the number of electrons in it. If the knockout frequency is adjusted to that corresponds to weak bunches to remove them, the betatron motion of the main bunch is scarcely affected. This method is routinely used in the single bunch operation of Photon Factory

Keywords

beam handling techniques; electron accelerators; storage rings; Photon Factory storage ring; RF knockout method; Touschck effect; betatron tune; impurity growth; single bunch operation; Dynamic range; Electrons; Impurities; Light scattering; Particle scattering; Photomultipliers; Production facilities; Radio frequency; Storage rings; Synchrotrons;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1995., Proceedings of the 1995

Conference_Location

Dallas, TX

Print_ISBN

0-7803-2934-1

Type

conf

DOI

10.1109/PAC.1995.505861

Filename

505861