DocumentCode :
1901697
Title :
A packaging technique for silicon MEMS strain sensors on steel
Author :
Ferri, Matteo ; Cristiani, Stefano ; Roncaglia, Alberto ; Kobayashi, Yusuke ; Soga, Kenichi
Author_Institution :
Inst. of Microelectron. & Microsyst., Nat. Res. Council of Italy, Bologna
fYear :
2008
fDate :
26-29 Oct. 2008
Firstpage :
1524
Lastpage :
1527
Abstract :
A packaging technique suited to applying MEMS strain sensors realized on a silicon chip to a steel flat surface is described. The method is based on adhesive bonding of the silicon chip rear surface on steel using two types of glue normally used for standard piezoresistive strain sensors (M-bond200/600), using direct wire bonding of the chip to a Printed Circuit Board, also fixed on steel. In order to protect the sensor from the external environment, and to improve the MEMS performance, the silicon chip is encapsulated with a metal cap hermetically sealed-off under vacuum condition with a vacuum adhesive in which the bonding wires are also protected from possible damage. In order to evaluate the mechanical coupling of the silicon chip with the bar and the stress transfer extent to the silicon surface, commercial strain sensors have been applied on the chip glued on a steel bar in a laboratory setup able to generate strain by inflection, yielding a stress transfer around 70% from steel to silicon.
Keywords :
lead bonding; microsensors; packaging; piezoresistive devices; strain sensors; adhesive bonding; direct wire bonding; packaging technique; silicon MEMS strain sensors; standard piezoresistive strain sensors; Bonding; Capacitive sensors; Mechanical sensors; Micromechanical devices; Packaging; Protection; Sensor phenomena and characterization; Silicon; Steel; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2008 IEEE
Conference_Location :
Lecce
ISSN :
1930-0395
Print_ISBN :
978-1-4244-2580-8
Electronic_ISBN :
1930-0395
Type :
conf
DOI :
10.1109/ICSENS.2008.4716737
Filename :
4716737
Link To Document :
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