Title :
A new approach for faster IC analysis with PICA: STPC-3D
Author :
Desplats, Romain ; Faggion, Gaël ; Beaudoin, Felix ; Perdu, Philippe ; Lundquist, Ted ; Shah, Ketan ; Chion, Alain ; Vallet, Michel ; Sardin, Philippe
Author_Institution :
French Space Agency, CNES, Toulouse, France
Abstract :
To reduce acquisition time with PICA (Picosecond Imaging Circuit Analysis), we have developed a Spatial Temporal Photon Correlation approach (STPC-3D) which reduces acquisition from hours to minutes. Applications are presented on several devices (i.e., Azuma 0.18 μm-1.8 V, Lazarus 0.18 μm-1.8 V and STm 0.12 μm-1.2 V) showing transistors and their commutations.
Keywords :
integrated circuit modelling; photon correlation spectroscopy; IC analysis; picosecond imaging circuit analysis; spatial temporal photon correlation; transistors; Background noise; Circuit analysis; Circuit testing; Data acquisition; Histograms; Microelectronics; Power supplies; Signal to noise ratio; Spatial databases; Voltage;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2003. IPFA 2003. Proceedings of the 10th International Symposium on the
Print_ISBN :
0-7803-7722-2
DOI :
10.1109/IPFA.2003.1222736
