DocumentCode :
1901934
Title :
Detailed Analysis of Transfer Inefficiency in SCCDs
Author :
Klar, H. ; Mauthe, M. ; Pfleiderer, H.-J.
Author_Institution :
Siemens AG, Research Laboratories, Hofmannstr. 51, 8000 Mÿnchen 70, West-Germany
fYear :
1977
fDate :
20-22 Sept. 1977
Firstpage :
101
Lastpage :
103
Abstract :
Considering the initial conditions of a 4-phase SCCD a new measurement technique is described, by which the effective interface state density can be determined with an error of approximately 30%.
Keywords :
Density measurement; Electrodes; Electron traps; Frequency; Interface states; Laboratories; Loss measurement; Measurement techniques; Performance loss; Signal analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Circuits Conference, 1977. ESSCIRC '77. 3rd European
Conference_Location :
Ulm, F.R. Germany
Print_ISBN :
380071132X
Type :
conf
Filename :
5435051
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1901934
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