Title :
Programmable termination for CML I/O´s in high speed CMOS transceivers
Author :
Ramaswamy, S. ; Gupta, V. ; Landman, P. ; Parthasarathy, B. ; Gu, R. ; Yee, A. ; Dyson, L. ; Wu, S. ; Lee, W.
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
This paper describes I/O circuits that can be used in high-speed transceivers to communicate with next generation and legacy devices. We describe the transmitter and receiver front-end circuits that are designed to operate with dual termination voltage supplies. The receiver characterization, ESD protection and system level power up issues related to gate-oxide and electro-migration reliability are discussed.
Keywords :
CMOS logic circuits; current-mode logic; data communication equipment; electromigration; electrostatic discharge; integrated circuit reliability; programmable circuits; protection; transceivers; CML I/O circuits; ESD protection; dual termination voltage supplies; electromigration reliability; gate oxide reliability; high speed CMOS transceivers; programmable termination; receiver characterization; receiver front-end circuits; system level power up issues; transmitter front-end circuits; Driver circuits; Electrostatic discharge; Impedance; MOS devices; Power system protection; Power system reliability; Switches; Transceivers; Transmitters; Voltage;
Conference_Titel :
VLSI Circuits Digest of Technical Papers, 2002. Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-7310-3
DOI :
10.1109/VLSIC.2002.1015049
